Distinguished Lecture

Stephen J. Pennycook

Stephen J. Pennycook is a Professor in the Materials Science and Engineering Dept., National University of Singapore, an Adjunct Professor in the University of Tennessee and Adjoint Professor in Vanderbilt University, USA. Previously, he was Corporate Fellow in the Materials Science and Technology Division of Oak Ridge National Laboratory and leader of the Scanning Transmission Electron Microscopy Group. He completed his PhD in physics at the Cavendish Laboratory, University of Cambridge in 1978. Since then he has been actively pursuing the development and materials applications of atomic resolution Z-contrast microscopy and electron energy loss spectroscopy. Pennycook is a Fellow of the American Physical Society, the American Association for the Advancement of Science, the Microscopy Society of America, the Institute of Physics and the Materials Research Society. He has received the Microbeam Analysis Society Heinrich Award, the Materials Research Society Medal, the Institute of Physics Thomas J. Young Medal and Award and the Materials Research Society Innovation in Characterization Award. He has 38 books and book chapters, over 400 publications in refereed journals and has given over 200 invited presentations. His latest book is "Scanning Transmission Electron Microscopy."

Instrumentation & New Techniques

Monday morning — Session chairs: Jo Verbeeck, Mathieu Kociak

Joshua McNeur (Univ. Erlangen, Germany)
From quantum‐optimal electron microscopy to laser‐based charged particle acceleration
Ben McMorran (Univ. Oregon, USA)
Electron microscopy with structured electrons
Refreshment break
Vincenzo Grillo (CNR, Italy)
Orbital angular momentum sorting of electron waves: principles and applications
Angus Kirkland (Oxford Univ., UK)
New paradigms for imaging in TEM & STEM using direct electron detectors
Hidetaka Sawada (Oxford Univ. UK; JEOL, UK)
Displacement measurement along the Z direction

Electron Microscopy Theory

Monday afternoon — Session chairs: Les Allen, Peter Schattschneider

Mark Oxley (ORNL, USA)
Correction of 2D STEM images for temporal incoherence and residual aberrations
Stefan Löffler (TU Wien, Austria)
Interferometric EELS: From magnetism to orbitals
Refreshment break
Axel Lubk (TU Dresden, Germany)
Quantum state reconstruction using a Transmission Electron Microscope
Laura Clark (Monash Univ., Australia)
Beam shaping in electron microscopy and materials imaging
Francisco Javier García de Abajo (ICFO, Spain)
Theoretical description of the ultrafast interaction between electron beams and plasmonic nanostructures

Operando Microscopy

Tuesday morning — Session chairs: Eric Stach, Ilke Arslan

Patricia Abellan (SuperSTEM, UK)
Synthesis and degradation dynamics of nanomaterials in liquid cells using radiation chemical methods
Thomas W. Hansen (DTU, Denmark)
Spatio‐temporally resolved in situ transmission electron microscopy of the dynamics of nanostructured materials
Refreshment break
Tevis Jacobs (Univ. of Pittsburgh, USA)
In situ TEM Investigations into contact mechanics and tribology at the nanoscale
Marc-Georg Willinger (Fritz Haber Institute, MPI-CEC, Germany)
Multi‐scale observation of active metal catalysts by in situ Scanning and Transmission Electron Microscopy Transmission Electron Microscopy
Matthijs van Spronsen (Harvard Univ., USA)
Probing catalysis with the powerful combination of electron microscopy and photon‐based techniques

Correlative Microscopy

Tuesday afternoon — Session chairs: Sarah Haigh, Jan Neethling

Ben Britton (Imperial College, UK)
Exploiting EBSD to correlate properties & diffraction in the Scanning Electron Microscope
David Seidman (Northwestern Univ., USA)
Correlative atom‐probe tomographic/transmission electron microscope and simulation studies of different materials
Refreshment break
Santhana Eswara (LIST, Luxembourg)
Electron microscopy and SIMS: A new paradigm in correlative microscopy
Thomas J. A. Slater (Univ. Manchester, UK)
3D Imaging across length scales using multiscale correlative tomography
Mathieu Kociak (LPS, Paris Sud, France)
New directions in the study of optical properties of nanostructures with free electrons beams

High Time-Resolved Microscopy

Wednesday morning — Session chairs: Yimei Zhu, Alexander Ziegler

R. J. Dwayne Miller (MPSD, DESY, Germany; Univ. Toronto, Canada)
Mapping atomic motions with ultrabright electrons: Realization of the chemists’ Gedanken Experiment
Chong-Yu Ruan (Michigan State Univ., USA)
Advances in femtosecond imaging and spectroscopy with high‐brightness beams in a TEM
Refreshment break
Florian Banhart (IPMC Strasbourg, France)
The electron dynamics in ultrafast stroboscopic and single‐shot TEM
Armin Feist (Univ. Goettingen, Germany)
Ultrafast TEM: probing nanoscale dynamics with coherent electron pulses
Xijie Wang (Stanford Univ., USA)
Making molecular movie with MeV electrons

Wednesday afternoon — Free time, Wednesday afternoon activities


Thursday morning — Session chairs: Juan Idrobo, Maria Varela

Robert Klie (Univ. of Illinois, USA)
In‐situ materials characterization at high spatial resolution: 2D materials based liquid-cell microscopy
Jaume Gazquez (ICMAB, Spain)
Linear dichroism in a Scanning Transmission Electron Microscope
Refreshment break
Yung-Chang Lin (AIST, Japan)
Exploring single atom spin state in graphene and 1D carbon chain by electron spectroscopy
Fredrik Hage (SuperSTEM, UK)
Momentum‐resolved phonon and plasmon spectroscopy using monchromated STEM-EELS
Phil Batson (Rutgers Univ., USA)
Phonon spectroscopy and mapping in nanostructures

Electron Tomography & Low-Dose Microscopy

Thursday afternoon — Session chairs: Christian Kisielowski, Rolf Erni

Peter Nellist (Oxford Univ., UK)
Quantitative atomic resolution characterization of materials using coherent and incoherent imaging
Stig Helveg (Haldor Topsoe, Denmark)
Electron microscopy of catalysts in action
Refreshment break
Sara Bals (Univ. Antwerpen, Belgium)
High resolution electron tomography: from model like systems to real nanomaterials
Fu-Rong Chen (Tsing Hua Univ.,Taiwan)
From low dose in‐line electron holography to atomic resolution tomography
Jianwei Miao (UCLA, USA)
Atomic electron tomography: Probing 3D structure and material properties at the single-atom level
FEMMS 2017 Distinguished Lecture — Stephen J. Pennycook

Materials and Microscopy

Friday morning — Session chairs: Naoya Shibata, Paul Franklyn

Andrew Stevens (PNNL, USA)
Computational electron imaging: Getting the information you need with combined hardware‐software sensing
Yuichi Ikuhara (Univ. Tokyo, Japan)
Atomic structures and chemistry of interfaces and surfaces in Li‐ion battery crystals
Refreshment break
Paul Midgley (Cambridge Univ., UK)
Crystal cartography using scanning electron diffraction
Patricia Kooyman (Univ. Cape Town, SA)
Development of operando Transmission Electron Microscopy
Johan Westraadt (Nelson Mandela Metrop. Univ., SA)
STEM‐EELS characterization of early stage spinodal decomposition in Fe‐Cr alloys

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